Method for polishing semiconductor substrate and apparatus for t

Abrading – Abrading process – Glass or stone abrading

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

451285, 451287, 451289, 451388, B24B 4106

Patent

active

059065320

ABSTRACT:
The method for polishing a semiconductor substrate includes the steps of (a) forming a flowing liquid layer between a semiconductor substrate and a substrate holder to thereby support the semiconductor substrate therebetween by surface tension of the flowing liquid layer, and (b) compressing the semiconductor substrate onto a polishing cloth including process liquid therein. The method ensures that a semiconductor substrate is not damaged at a reverse surface thereof and also that a semiconductor substrate is not contaminated by particles contained in process liquid, because the flowing liquid layer prevents particles of process liquid from entering between the semiconductor substrate and the substrate holder.

REFERENCES:
patent: 3579916 (1971-05-01), Boettcher
patent: 4466852 (1984-08-01), Beltz et al.
patent: 4519168 (1985-05-01), Cesna
patent: 4521995 (1985-06-01), Sekiya
patent: 4625463 (1986-12-01), Sekiya
patent: 5423716 (1995-06-01), Strasbaugh
European Examination Report under Section 18(3), dated Dec. 9, 1997.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for polishing semiconductor substrate and apparatus for t does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for polishing semiconductor substrate and apparatus for t, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for polishing semiconductor substrate and apparatus for t will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-398659

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.