Method for plasma treatment

Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching

Reexamination Certificate

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C438S714000, C438S723000

Reexamination Certificate

active

07115519

ABSTRACT:
A method for plasma treatment etches an SiC layer with an increased etching rate and enhanced selectivities of SiC with respect to SiO2and an organic layer. An etching gas is converted into plasma to etch SiC. The etching gas may include CHF3; CHF3and N2, for example, a mixed gas of CHF3, N2and Ar; or a material having C, H and F and a material having N but without any material having O.

REFERENCES:
patent: 5627395 (1997-05-01), Witek et al.
patent: 5958793 (1999-09-01), Patel et al.
patent: 6009830 (2000-01-01), Li et al.
patent: 6103590 (2000-08-01), Swanson et al.
patent: 6284657 (2001-09-01), Chooi et al.
patent: 6472231 (2002-10-01), Gabriel et al.
patent: 6617244 (2003-09-01), Nishizawa
patent: 6635185 (2003-10-01), Demmin et al.
patent: 6670278 (2003-12-01), Li et al.
patent: 6764958 (2004-07-01), Nemani et al.

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