Method for performing statistical post processing in...

Details Method for performing statistical post processing in... Method for performing statistical post processing in...

2005-09-06

2005-09-06

Dang, Phuc T. (Department: 2818)

Semiconductor device manufacturing: process

With measuring or testing

C438S068000

Reexamination Certificate

active

06939727

ABSTRACT:
A method of manufacturing a semiconductor integrated circuit includes providing a fabricated integrated circuit on a wafer. A test fixture is connected to unencapsulated pads on the integrated circuit to monitor an operating parameter for the circuit and to determine a unique identifier for the die. The parameter is analyzed in post processing.

REFERENCES:
patent: 5206171 (1993-04-01), Dillon et al.
patent: 5557573 (1996-09-01), McClure
patent: 6161213 (2000-12-01), Lofstrom
patent: 6714031 (2004-03-01), Seki

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