Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1996-11-08
1999-06-01
Ballato, Josie
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324765, 439 91, G01R 3102
Patent
active
059091231
ABSTRACT:
The present invention relates to a system and method for performing reliability screening on semi-conductor wafers and particularly to a highly planar burn in apparatus and method for uses including wafer level burn-in (WLBI), diced die burn-in (DDBI), and packaged die burn-in (PDBI). The burn-in system includes a burn-in substrate with a planar base, a temporary Z-axis connecting member, and a Z-axis wafer level contact sheet electrically coupled to one another for screening wafers, diced die, and packaged electronic components, their assembly and use.
REFERENCES:
patent: Re26837 (1970-03-01), Evans
patent: 3609547 (1971-09-01), Slusser
patent: 3736471 (1973-05-01), Donze et al.
patent: 3953566 (1976-04-01), Gore
patent: 4133592 (1979-01-01), Cobaugh et al.
patent: 4482516 (1984-11-01), Bowman et al.
patent: 4530779 (1985-07-01), Mayama et al.
patent: 4540229 (1985-09-01), Madden
patent: 4683550 (1987-07-01), Jindrick et al.
patent: 4705762 (1987-11-01), Ota et al.
patent: 4733461 (1988-03-01), Nakano
patent: 4840570 (1989-06-01), Mann, Jr. et al.
patent: 4963225 (1990-10-01), Lehman-Lamer
patent: 4968931 (1990-11-01), Littlebury et al.
patent: 4985296 (1991-01-01), Mortimer, Jr.
patent: 5007163 (1991-04-01), Pope et al.
patent: 5206585 (1993-04-01), Chang et al.
patent: 5252857 (1993-10-01), Kane et al.
patent: 5315481 (1994-05-01), Smolley
patent: 5380210 (1995-01-01), Gabbe et al.
patent: 5428190 (1995-06-01), Stopperan
patent: 5437556 (1995-08-01), Bargain et al.
patent: 5440240 (1995-08-01), Wood et al.
patent: 5461328 (1995-10-01), Devereaux et al.
patent: 5498467 (1996-03-01), Meola
patent: 5541524 (1996-07-01), Tuckerman et al.
patent: 5602491 (1997-02-01), Vasquez et al.
Light et al. "Process Considerations in the Fabrication of Fluoropolymer Printed Circuit Boards," IEEE Transactions on Components, Packaging, and Manufacturing Technology, vol. 18, No. 1, Mar. 1, 1995, pp. 118-126.
Ballato Josie
Genco, Jr. Victor M.
Kobert Russell M.
W. L. Gore & Associates, Inc.
LandOfFree
Method for performing reliability screening and burn-in of semi- does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for performing reliability screening and burn-in of semi-, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for performing reliability screening and burn-in of semi- will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-957146