Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent
1996-09-03
2000-07-04
Ballato, Josie
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
3242441, 324 96, G01R 3302, G01R 3100
Patent
active
060843969
ABSTRACT:
A laser probe for measuring a magnetic field is disclosed. A polarized laser beam is passed through a magneto-optic crystal in the presence of an unknown magnetic field. The rotation of the polarization which occurs through the magneto-optic crystal is measured in order to determine the magnitude of the magnetic field. The measured magnetic field is used to determine, for example, the current through a conductor such as an interconnect line on a semiconductor chip. A method of calibrating the magnetic field using a known magnetic from a solenoid is also disclosed. Further disclosed is a method of providing a zero-reference current by momentarily stopping the chip clock.
REFERENCES:
patent: 4242635 (1980-12-01), Burns
patent: 4516073 (1985-05-01), Doriath
patent: 4560867 (1985-12-01), Papuchon
patent: 4618819 (1986-10-01), Mourou et al.
patent: 4894608 (1990-01-01), Ulmer, Jr.
patent: 4933629 (1990-06-01), Kozuka et al.
patent: 4947107 (1990-08-01), Doerfler
patent: 4956607 (1990-09-01), Abe et al.
patent: 4996475 (1991-02-01), Takahashi
patent: 5134362 (1992-07-01), Ochi
patent: 5451863 (1995-09-01), Freeman
"Holography Handbook" Fred Unterseher p. 8241 (Date Unavailable).
Roger F. Belt and John B. Ings, "Growth Of Bismuth Garnet Films For High Figure Of Merit Faraday Effects Devices" Airtron Div. of Litton Industries, Inc. SPIE vol. 753 Acousto-Optic, Electro-Optic, and Magneto-Optic Devices and Applications (1987) pp. 142-149. (No Month).
Ann N. Campbell, Edward I. Cole, Jr., Bruce A. Dodd, and Richard E. Anderson, "Internal Current Probing Of Integrated Circuits Using Magnetic Force Mircoscopy", Failure Analysis, Dept. 2275 Microelectronics Quality/Reliability Center Sandia National Laboratories, 1993 IEEE/IRPS pp. 168-177. (No Month).
Ann N. Campbell, Edward J. Cole, Jr., Bruce A. Dodd and Richard E. Anderson, "Magnetic Force Microscopy/Current Contrast Imaging: A New Technique For Internal Current Probing Of IC's," Microelectronic Engineering, vol. 24, nos. 1-4, Mar. 1994, pp. 11-22.
K. Helmreich, P. Nagel, W. Wolz, K. D. Muller-Glaser, "Investigations On Chip-Internal Current Contrast Imaging And Measurement Using An Electron Beam Tester," 3rd European Conference On Electron And Optical Beam Testing Of Integrated Circuits, Sep. 9-11, 1994, pp. 152-161.
R. Wolfe, E. M. Gyorgy, R. A. Lieberman, V. J. Fratello, S. J. Licht, M. N. Deeter and G. W. Day, "High Frequency Magnetic Field Sensors Based On The Faraday Effect In Garnet Thick Films," Applied Physsics Letters 60[17] Apr. 1992, pp. 2048-2050.
Ballato Josie
Intel Corporation
Kobert Russell M.
LandOfFree
Method for performing quantitative measurement of DC and AC curr does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for performing quantitative measurement of DC and AC curr, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for performing quantitative measurement of DC and AC curr will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1489637