Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Logic design processing
Reexamination Certificate
2011-05-03
2011-05-03
Rossoshek, Helen (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Integrated circuit design processing
Logic design processing
C716S100000, C716S101000, C716S103000, C716S105000, C716S106000, C716S112000, C716S117000, C714S026000, C714S037000, C714S047300, C714S057000
Reexamination Certificate
active
07937679
ABSTRACT:
A method for performing failure mode and effects analysis (FMEA) on integrated circuits including preparing a FMEA database of an integrated circuit under design and computing FMEA results from the FMEA database. Information is automatically extracted from an integrated circuit description. The extraction of information includes reading integrated circuit information, partitioning the circuit in invariant and elementary sensitive zones (SZ), using the information in the preparation step of a FMEA database. Optionally a FMEA validation stage may be performed with which FMEA computed results are compared with FMEA measured results to obtain FMEA validated results.
REFERENCES:
patent: 4228537 (1980-10-01), Henckels et al.
patent: 5109380 (1992-04-01), Ogino
patent: 5269014 (1993-12-01), Ogino
patent: 5546321 (1996-08-01), Chang et al.
patent: 5548539 (1996-08-01), Vlach et al.
patent: 5646862 (1997-07-01), Jolliffe et al.
patent: 6658375 (2003-12-01), McQuarrie et al.
patent: 6909994 (2005-06-01), Johnson et al.
patent: 7017080 (2006-03-01), Liggesmeyer et al.
patent: 7035769 (2006-04-01), Cutuli et al.
patent: 7082384 (2006-07-01), Sasaki et al.
patent: 7139676 (2006-11-01), Barford
patent: 7177773 (2007-02-01), Lonn et al.
patent: 7200543 (2007-04-01), Palladino
patent: 7260501 (2007-08-01), Pattipatti et al.
patent: 7536284 (2009-05-01), Linzey et al.
patent: 2005/0028045 (2005-02-01), Kawaike
patent: 2005/0254456 (2005-11-01), Sakai et al.
patent: 2006/0122873 (2006-06-01), Minotto
patent: 2008/0034258 (2008-02-01), Moriya et al.
patent: 2009/0113247 (2009-04-01), Gofuku et al.
patent: 2010/0125746 (2010-05-01), Herrmann et al.
patent: 01319009 (2003-09-01), None
patent: 02-016471 (1990-01-01), None
Price; “AutoSteve: electrical desThroop et al.;ign analysis”; Publication Year: 1997; Applications of Model-Based Reasoning (Digest No: 1997/338), IEE Colloquium on; pp. 4/1-4/3.
Throop et al.; “Automated incremental design FMEA”; Publication Year: 2001; Aerospace Conference, 2001, IEEE Proceedings; vol. 7; pp. 7-3458 vol. 7.
Kukkal et al.; “Database design for failure modes and effects analysis”; Publication Year: 1993; Reliability and Maintainability Symposium, 1993. Proceedings., Annual; pp. 231-239.
Papadopoulos et al.; “Automating the failure modes and effects analysis of safety critical systems”; Publication Year: 2004; High Assurance Systems Engineering, 2004. Proceedings. Eighth IEEE International Symposium on; pp. 310-311.
European Search Report from corresponding European Patent Application No. EP 07106186 completed May 29, 2007.
Yiannis Papadopoulos et al., “A Method and Tool Support for Model-based Semi-automated Failure Modes and Effects Analysis of Engineering Designs”, Safety Critical Systems and Software, XX, XX, vol. 47, Oct. 2004, XP002413947.
Palumbo, D., “Automating failure modes and effects analysis”, Reliability and Maintainability Symposium, 1994. Proceedings., Annual Anaheim, CA, USA Jan. 24-27, 1994, New York, NY, USA, IEEE Jan. 24, 1994, pp. 304-309, XP010120628; ISBN: 0-7803-1786-6.
Cardona, Esq. Victor A.
Heslin Rothenberg Farley & & Mesiti P.C.
Rossoshek Helen
Yogitech S.p.A.
LandOfFree
Method for performing failure mode and effects analysis of... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for performing failure mode and effects analysis of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for performing failure mode and effects analysis of... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2652242