Image analysis – Pattern recognition – Feature extraction
Patent
1995-08-22
1997-11-04
Boudreau, Leo
Image analysis
Pattern recognition
Feature extraction
382196, 382190, 382187, G06K 950, G06K 946, G06K 900
Patent
active
056848927
ABSTRACT:
A method for pattern recognition is provided which creates statistics in a data base, based upon a number of characteristics extracted from a large number of samples of the pattern to be recognized. The data contains an inverse matrix of a correlation matrix of the characteristics, and the means and standard deviations of the characteristics. When a pattern is received to be recognized, the values of the characteristics of the pattern received are used to compute a Mahalanobis distance. The Mahalanobis distance is computed from the values of the characteristics of the pattern received and the statistics in the data base.
REFERENCES:
patent: 3244810 (1966-04-01), Williams
patent: 3346845 (1967-10-01), Fomenko
Boudreau Leo
Davis Monica S.
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