Method for particle size and concentration measurement

Optics: measuring and testing – By particle light scattering – With photocell detection

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C356S335000

Reexamination Certificate

active

07746469

ABSTRACT:
The present invention provides a system and method of particle size and concentration measurement based on providing a focused, synthesized, non-Gaussian laser beam, causing the beam to interact with the particles, measuring the interaction signal and the number of interactions per unit time of the beam with the particles, and using algorithms to map the interaction signals to the particle size and the number of interactions per unit time to the concentration. The particles are fluid borne, airborne, or on a surface and have a size ranging from sub-micron to thousands of microns. In an embodiment of the invention, the focused, synthesized, non-Gaussian laser beam is a dark beam. The measurements can be made using the duration of interaction with a scanning beam, including dark field.

REFERENCES:
patent: 4806774 (1989-02-01), Lin et al.
patent: 5063301 (1991-11-01), Turkevich et al.
patent: 5471298 (1995-11-01), Moriya
patent: 5999256 (1999-12-01), Jones et al.
patent: 6084671 (2000-07-01), Holcomb
Jones, A.R., “Light scattering for particle characterization,” Progress in Energy and Combustion Science, Feb. 1, 1999, pp. 1-53.
Piestun Rafael, “Multidimensional Synthesis of Light Fields,” Optics & Photonics News, Nov. 2001, p. 28, XP002302678.
Matizen , Y. et al., “Formation of non-Gaussian light beams with the aid of a spatially inhomogeneous amplitude filter,” Soviet Journal of Quantum Electronics, 17 (1987) Jul., No. 7, New York, New York, USA, XP-000709131.
Friedmann Michael et al., “Surface Analysis Using Multiple Coherent Beams,” Electrical and Electronics Engineers in Israel, Nov. 5, 1996, pp. 537-540, XP002302680.
Friedmann Michael et al., “Resolution enhancement by extrapolation of the optically measured spectrum of surface profiles,” Applied Optics, Jan. 10, 1996; No. 23; XP002302680.
Piestun Rafael et al., “Pattern generation with an extended focal depth,” Applied Optics, Aug. 10, 1998, vol. 37, No. 23, XP002302681.
Spektor Boris et al., “Dark beams with a constant notch,” Optic Letters, Online!, Dec. 12, 1995, vol. 21, No. 7, pp. 456-458, XP002302682.
T. Allen, “Particle size analysis 1981,” John Wiley & Sons, ISBN: 0471262218, Jun. 1983.
B. Weiner et al., “Improvements in Accuracy and Speed Using the Time-of-Transition Method and Dynamic Image Analysis for Particle Size,” 1998 American Chemical Society, Ch. 8, pp. 88-102.
R. Piestun et al., “Synthesis of Three-Dimensional Light Fields and Applications,” Proc. IEEE, vol. 90(2), pp. 220-244 (Feb. 2002).
R. Piestun et al., “Control of wave-front propagation with diffractive elements,” Optical Society of America, vol. 19, pp. 771-773, (1994).
R. Piestun et al., “Unconventional light distributions in three-dimensional domains,” Journal of Modern Optics, vol. 43, pp. 1495-1507, (1996).
R. Piestun et al., “Wave fields in three dimensions: analysis and synthesis,” Optical Society of America, vol. 13, pp. 1837-1848, (1996).
F. Durst, et al., “Light Scattering by Small Particles Refined Numerical Computations,” Report SFB 80/TM/195, Jul. 1981.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for particle size and concentration measurement does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for particle size and concentration measurement, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for particle size and concentration measurement will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4224473

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.