Method for optimizing test order, and machine-readable media...

Details Method for optimizing test order, and machine-readable media... Method for optimizing test order, and machine-readable media...

2006-05-23

2006-05-23

Tsai, Carol S. W. (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S081000, C702S181000, C702S182000, C702S183000, C700S109000, C700S110000, C700S121000, C438S014000, C438S015000

Reexamination Certificate

active

07050922

ABSTRACT:
In a test order optimization method, a pass probability and resource requirement are identified for each of a plurality of tests. A pass-weighted resource requirement factor is then generated for each of the tests in accord with the test's pass probability and resource requirement. Thereafter, the tests are ordered to be executed in accord with their pass-weighted resource requirement factors.

REFERENCES:
patent: 5922079 (1999-07-01), Booth et al.
patent: 6078189 (2000-06-01), Noel
patent: 6167352 (2000-12-01), Kanevsky et al.
patent: 6959252 (2005-10-01), Tai et al.
patent: 2005/0066298 (2005-03-01), Visweswariah
patent: 2005/0210311 (2005-09-01), Rodeheffer
patent: 2005/0217349 (2005-10-01), Stremler et al.

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