Method for operating an optical emission spectrometer

Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation

Reexamination Certificate

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Details

C250S458100, C250S461200, C356S301000, C356S318000, C356S417000

Reexamination Certificate

active

07911606

ABSTRACT:
The invention relates to a method for the spectral analysis of metal samples with the following steps:a. Recording of a spectrum of an unknown sample with a number of preset excitation parameters,b. Comparison of the spectrum with stored spectra of a number of control samples,c. Determination of the control sample with the best concordance of spectra,d. Setting of the excitation parameters, which are stored for the best and closest control sample determined in step c,e. Recording of the spectrum of the unknown sample with the excitation parameters set in step d,f. Calculation of the intensity ratios of the analysis lines stored for the control sample and the internal standards of the spectrum recorded in step e.

REFERENCES:
patent: 5141314 (1992-08-01), Belmore et al.
patent: 2005/0140974 (2005-06-01), Irie et al.
patent: 2005/0174583 (2005-08-01), Chalmers et al.
patent: 4106627 (1992-05-01), None
patent: 19753348 (1999-06-01), None
patent: 10152679 (2003-04-01), None
patent: 0396291 (1990-11-01), None
patent: 1035410 (2000-09-01), None
patent: 1355145 (2003-10-01), None
patent: 1486772 (2004-12-01), None
International Search Report issued in corresponding International Application No. PCT/EP2005/011799 on Feb. 22, 2006.
Written Opinion issued in corresponding International Application No. PCT/EP2005/011799 on Jul. 24, 2007.

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