Method for on-line evaluation of materials using prompt...

Induced nuclear reactions: processes – systems – and elements – Nuclear transmutation – Gamma or charged particle activation analysis

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C376S159000, C250S358100

Reexamination Certificate

active

07630469

ABSTRACT:
A method for evaluating a material specimen comprises: Mounting a neutron source and a detector adjacent the material specimen; bombarding the material specimen with neutrons from the neutron source to create prompt gamma rays within the material specimen, some of the prompt gamma rays being emitted from the material specimen, some of the prompt gamma rays resulting in the formation of positrons within the material specimen by pair production; collecting positron annihilation data by detecting with the detector at least one emitted annihilation gamma ray resulting from the annihilation of a positron; storing the positron annihilation data on a data storage system for later retrieval and processing; and continuing to collect and store positron annihilation data, the continued collected and stored positron annihilation data being indicative of an accumulation of lattice damage over time.

REFERENCES:
patent: 2509344 (1950-05-01), Herzog
patent: 2811650 (1957-10-01), Wagner
patent: 3593025 (1971-07-01), Grosskreutz
patent: 3792253 (1974-02-01), Wylie et al.
patent: 3803416 (1974-04-01), Strauss
patent: 3924125 (1975-12-01), Murray
patent: 3970855 (1976-07-01), Holt et al.
patent: 4064438 (1977-12-01), Alex et al.
patent: 4463263 (1984-07-01), Padawer
patent: 4622200 (1986-11-01), Gold et al.
patent: 4756866 (1988-07-01), Alvarez
patent: 4835390 (1989-05-01), Blatchley et al.
patent: 4897549 (1990-01-01), Zerda et al.
patent: 4980901 (1990-12-01), Miller
patent: 4983841 (1991-01-01), Stewart et al.
patent: 5175756 (1992-12-01), Pongrantz et al.
patent: 5200619 (1993-04-01), Kumar et al.
patent: 5530245 (1996-06-01), Huang
patent: 5774520 (1998-06-01), Bolotin
patent: 6178218 (2001-01-01), Akers
patent: 6236050 (2001-05-01), Tumer
patent: 6639210 (2003-10-01), Odom et al.
patent: 6693277 (2004-02-01), Cowan et al.
patent: 2003/0165213 (2003-09-01), Maglich et al.
Derlet et al., A positron annihilation lifetime spectroscopy study of porous silicon using a continuous lifetime fitting algorithm, Journal of Materials Science Letters 15 (1996), pp. 1949-1952.
Banzuch et al., “Study of the Van Cittert and Gold iterative methods of deconvolution and their application in the deconvolution of experimental spectra of positron annihilation,” Nuclear Instruments and Methods in Physics Research A 384 (1997), pp. 506-516.
Zhu et al., “Analysis of positron annihilation lifetime data presented as a sum of convoluted exponentials with the program SPLMOD”, Nuclear Instruments and Methods in Physics Research A284 (1989), pp. 443-451.
Shaffer, Deconvoluted Doppler Broadened Positron Annihilation Spectroscopy: Characterization of Defects in Aluminum, University Microfilms International, 1985.
Gregory et al., “Analysis of Positron Annihilation Lifetime Data by Numerical Laplace Innversion with Program CONTIN,” Nuclear Instruments and Methods in Physics Research A290 (1990), pp. 172-182.
Richard B. Firestone, “The Berkeley Laboratory Isotopes Project Exploring the Table of Isotopes” (http://is.lbl.gov/education/isotopes.htm) last updated May 22, 2000, accessed by Examiner on Nov. 10, 2003, 8:51 am.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for on-line evaluation of materials using prompt... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for on-line evaluation of materials using prompt..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for on-line evaluation of materials using prompt... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4148134

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.