Method for numerically simulating an electrical circuit

Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system

Reexamination Certificate

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C703S017000

Reexamination Certificate

active

10422580

ABSTRACT:
A method using a computer program for numerically simulating an electrical circuit, in a computer system, having a plurality of nodes and a plurality of circuit elements. A circuit description of the electrical circuit together with tstartand tstoptimes of a time interval are read into the computer system with at least one input value of the electrical circuit for at least one specific time in the time interval. Voltage values and/or current values at the nodes of the electrical circuit are calculated in the selected time interval using table-based models for the circuit elements. From these voltage values and/or current values, a simulation time tnin the time interval [tstart; tstop] under consideration is selected at which system equations are determined describing the circuit elements by physical formulas and dynamic effects of the elements are described by differential equations. The system equations are solved to calculate the voltage and/or current values at the nodes at the selected simulation time and a profile of previously calculated voltage and/or current values in the time interval are output from the computer system.

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Ian Sinclair, Collins Dictionary of Computing, 2000, Paperback 0-00-472512-3 (on-line edition), pp.: definitions of “download” and “network”.
Nagel, L. W.: “Spice2: A Computer Program to Simulate Semiconductor Circuits”, Electronics Research Laboratory, University of California, Berkeley, ERL-M520, May 9, 1975, coversheet and pp. 174-187.
Kielkowski, R. M.: “Inside Spice, Overcoming the Obstacles of Circuit Simulation”, McGraw-Hill, Inc., New York, 1994, pp. coversheet and pp. 126-145.
Chua, L. O. et al.: “Computer-Aided Analysis of Electronic Circuits”, Prentice-Hall, Inc., Engelwood Cliffs, New Jersey, 1975, coversheet and pp. 62-97.

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