Method for non-destructive inspection, apparatus thereof and...

Image analysis – Applications – Manufacturing or product inspection

Reexamination Certificate

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Details

C382S108000, C382S154000, C382S284000, C382S287000, C382S294000, C348S125000

Reexamination Certificate

active

10057562

ABSTRACT:
An image input can be executed without any influence of physical conditions of an inspection object and environment such as installation area by utilizing a cordless type image pickup apparatus in the excellent portability combining a lighting apparatus to a digital camera. On the occasion of picking up an image of such inspection object, marks of the shape such as the rectangular shape, circular shape and linear line shape and marks of the shape combining the linear lines (plus sign (+), capital letter L or cross (+)) of known size are allocated within the same image and these marks are extracted simultaneously. Thereby, compensation process for the magnifying factor, position and tilt is conducted using the marks allocated in the image with the equal interval. Input data is continuously applied depending on the inspection object to generate a total inspection map by combining such input data. A computer executes a flaw detection process and stores the processing result in the form of a file together with the inspection images. Thereby, an inspection management system for search using information and inspection result of the inspection object as the characteristics element can be established.

REFERENCES:
patent: 5140647 (1992-08-01), Ise et al.
patent: 5257325 (1993-10-01), Casparian et al.
patent: 5469274 (1995-11-01), Iwasaki et al.
patent: 5621817 (1997-04-01), Bozinovic et al.
patent: 5663806 (1997-09-01), Grise et al.
patent: 6078701 (2000-06-01), Hsu et al.
patent: 6424752 (2002-07-01), Katayama et al.
patent: 6744931 (2004-06-01), Komiya et al.
patent: 6978052 (2005-12-01), Beged-Dov et al.
patent: 7009638 (2006-03-01), Gruber et al.
patent: 2002/0126890 (2002-09-01), Katayama et al.
patent: 2003/0076406 (2003-04-01), Peleg et al.
patent: 1167964 (2002-01-01), None
patent: 06-118062 (1994-04-01), None
patent: WO 00/60344 (2002-10-01), None

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