Method for non-contact testing of fixed and inaccessible...

Details Method for non-contact testing of fixed and inaccessible... Method for non-contact testing of fixed and inaccessible...

2007-04-24

2007-04-24

Nguyen, Vincent Q. (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

For fault location

C324S658000, C324S761010

Reexamination Certificate

active

11069406

ABSTRACT:
A method for testing for a defect condition on a node-under-implicit-test of an electrical device is presented. The technique according to the invention includes stimulating a first node of the electrical device that is capacitively coupled to the node-under-implicit-test with a known source signal, and capacitively sensing a signal on a second node of the electrical device that is capacitively coupled to the node-under-implicit-test. A defect condition such as a short or open can be determined from the capacitively sensed signal.

REFERENCES:
patent: 5420500 (1995-05-01), Kerschner
patent: 5498964 (1996-03-01), Kerschner et al.
patent: 5557209 (1996-09-01), Crook et al.
patent: 7057395 (2006-06-01), Williamson

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