Method for monitoring the surface resistivity of metallized film

Radiant energy – Invisible radiant energy responsive electric signalling – Infrared responsive

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250339, 324 62, G01J 100

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active

039354580

ABSTRACT:
Described herein is a method of monitoring surface resistivity distribution resulting from vacuum deposition of thin, transparent metal films on moving plastic film or other transparent substrates. The process comprises applying to the metallized film electromagnetic radiation and detecting a band width of electromagnetic radiation transmitted through or reflected from the metallized film in the near-infrared region, more particularly within the wavelength range of about 1.5 to 3.0 microns. The detected band width permits excellent correlation between emanant radiation and local conductivity or, reciprocally, resistivity of vacuum deposited gold, silver, and copper. Vacuum deposition can occur, e.g., by vacuum evaporation or sputtering. The metallized films are useful in the production of electrically heated transparent closures such as for automobile windshields.

REFERENCES:
patent: 3413474 (1968-11-01), Freeh
patent: 3448268 (1969-06-01), Proctor

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