Method for monitoring deformations with light waveguides

Details Method for monitoring deformations with light waveguides Method for monitoring deformations with light waveguides

1990-08-24

1991-09-03

Myracle, Jerry W.

Measuring and testing

Specimen stress or strain, or testing by stress or strain...

By loading of specimen

25022714, G01L 124

Patent

active

050442058

ABSTRACT:
A method for the monitoring of deformation of components with light waveguides which are connected securely to the component at least over part of the length of the latter and are connected to a measuring apparatus with which the transmitting capacity of the light waveguide and the transit time and/or the damping of the light pulses sent through the light waveguides are continuously or intermittently monitored. The light waveguides are prestressed such that they remain in tension at all levels of deformation expected.

REFERENCES:
patent: 4654520 (1987-03-01), Griffiths
patent: 4671659 (1987-06-01), Rempt et al.

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