Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1996-06-26
1997-05-27
Evans, F. L.
Optics: measuring and testing
By polarized light examination
With light attenuation
25055929, 25055938, G01B 1114
Patent
active
056337175
ABSTRACT:
To image a surface of an object more efficiently using automatic positioning of the object with respect to the optical axis of a camera while keeping the surface of the object at a predetermined angular orientation with respect to the optical axis, a general shape of the object is first measured and a mathematical function approximating the surface is determined. Relative displacements and orientations for an imaging path are then calculated and the object is manipulated along the imaging path while being imaged with the surface of the object being at the predetermined angular orientation. The speed and accuracy of surface imaging is improved.
REFERENCES:
patent: 5231470 (1993-07-01), Koch
patent: 5379106 (1995-01-01), Baldur
Evans F. L.
Forensic Technology (Wai) Inc.
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