Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate
2007-10-16
2007-10-16
Hoang, Huan (Department: 2827)
Static information storage and retrieval
Floating gate
Particular biasing
C365S185230, C365S185020, C365S185180
Reexamination Certificate
active
10838962
ABSTRACT:
The present invention provides a method for determining program and erase states in flash memory devices. Specifically, one embodiment of the present invention discloses a method for minimizing false detection of states in an array of non-volatile floating gate memory cells. A plurality of word lines are arranged in a plurality of rows. A plurality of bit lines are arranged in a plurality of columns. The method begins by determining a selected bit line that is associated with a column of memory cells. Then, the method continues by biasing a group of word lines at a negative voltage. The group of word lines are electrically coupled to the associated memory cells. The application of negative voltage to the group of word lines limits leakage current contributions from the associated memory cells in the column of memory cells when performing a verify operation.
REFERENCES:
patent: 5943262 (1999-08-01), Choi
patent: 6055190 (2000-04-01), Lu et al.
patent: 6172917 (2001-01-01), Kataoka et al.
patent: 6285593 (2001-09-01), Wong
patent: 6333662 (2001-12-01), Umezawa et al.
patent: 6356481 (2002-03-01), Micheloni et al.
patent: 6975538 (2005-12-01), Abedifard et al.
Akaogi Takao
Fastow Richard
He Yue-Song
Leung Wing
Wang Zhigang
Hoang Huan
Spansion LLC
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