Method for microbeam ion radiation testing of photonic devices

Details Method for microbeam ion radiation testing of photonic devices Method for microbeam ion radiation testing of photonic devices

1994-03-07

1995-04-11

Nelms, David C.

Radiant energy

Photocells; circuits and apparatus

Photocell controlled circuit

250216, 250306, 25049221, G01R 3128

Patent

active

054060729

ABSTRACT:
The disclosed method is for radiation testing of a nanostructure photonic device under test (DUT). The method comprises the application of a beam of optical energy to the DUT, and then establishing a computer data base for the performance of the device under test during the application of the beam. Thereafter, a tightly focused, steerable radiation beam is generated and focused on to a selected nano sized area of the DUT. A second data base is established for the performance of the DUT resulting from the application of the radiation beam, and the data of the first data base are compared with the data of said second data base to determine the affects of applying the radiation beam to the DUT, or to alter the device physical properties such as its refractive indicies, absorption, preferred polarization, and electrooptic characteristics, including electrooptic coefficients, photoelastic constants, operational (fundamental) wavelength and coupling coefficients.

REFERENCES:
patent: 4878104 (1989-10-01), Reed et al.
patent: 5126553 (1992-06-01), England et al.
patent: 5140164 (1992-08-01), Talbot et al.
patent: 5160991 (1992-11-01), Delacourt et al.
patent: 5175495 (1992-12-01), Brahme et al.
patent: 5247168 (1993-09-01), Pocholle et al.

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