Method for measuring yield and moisture

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

324688, 324664, G01R 2726

Patent

active

061217824

ABSTRACT:
A method and apparatus for measuring at least one parameter including mass flow rate or moisture content of material moved by a conveyor are disclosed herein. The method includes the steps of applying an electric field to the material using a non-intrusive sensor assembly, generating signals related to the dielectric value of the material, and processing the signals to determine the parameter. The apparatus includes a capaciflector sensor assembly located along a surface of the conveyor to generate an electric field applied to the material and a processing circuit to determine the parameter based upon the signals output from the sensor assembly. The sensor assembly includes a first conductor spaced between a stationary member of the conveyor and the material, and a second conductor spaced between the first conductor and the stationary member to act as a shield for reducing parasitic capacitance between the first conductor and a reference plane. The first conductor forms a first electrode of a sensor capacitor and the material forms a second electrode, and the capacitance depends on the parameters of the material. A cover may be located between the sensor assembly and material. The processing circuit performs a frequency analysis over any number of frequencies to determine the mass flow rate, moisture content or type of material, and the conveyor's speed.

REFERENCES:
patent: 4058766 (1977-11-01), Vogel et al.
patent: 4228393 (1980-10-01), Pile
patent: 4336493 (1982-06-01), Gregory et al.
patent: 4370611 (1983-01-01), Gregory et al.
patent: 4433286 (1984-02-01), Capots et al.
patent: 4683418 (1987-07-01), Wagner
patent: 4881025 (1989-11-01), Gregory
patent: 4896795 (1990-01-01), Ediger
patent: 4932243 (1990-06-01), Suh
patent: 4991128 (1991-02-01), Evans et al.
patent: 5166679 (1992-11-01), Vranish et al.
patent: 5214388 (1993-05-01), Vranish et al.
patent: 5351558 (1994-10-01), Horn et al.
patent: 5363051 (1994-11-01), Jenstrom et al.
patent: 5373245 (1994-12-01), Vranish
patent: 5442347 (1995-08-01), Vranish
patent: 5487702 (1996-01-01), Campbell et al.
patent: 5515001 (1996-05-01), Vranish
patent: 5521515 (1996-05-01), Campbell

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for measuring yield and moisture does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for measuring yield and moisture, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for measuring yield and moisture will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1076890

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.