Coherent light generators – Particular active media – Semiconductor
Reexamination Certificate
2007-11-13
2007-11-13
Harvey, Minsun Oh (Department: 2828)
Coherent light generators
Particular active media
Semiconductor
C372S038100
Reexamination Certificate
active
10989175
ABSTRACT:
Reverse bias leakage testing may be used to determine the health of a vertical cavity surface emitting laser (VCSEL). When VCSELs are integrated on a die with other electronic devices such testing may damage the other electronic devices or be prohibited by circuits on the die designed to protect the electronics from being reverse biased. Accordingly, reverse bias testing may be facilitated by providing a second ground pad, separate from the die ground pad, specific to the VCSEL.
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Int'l Application No.: PCT/US2005/041373 Int'l Search Report & Written Opinion dated May 30, 2006.
Harvey Minsun Oh
Intel Corporation
Nguyen Phillip
Reif Kevin A.
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