Method for measuring thickness of magnetic recording medium

Coating processes – Measuring – testing – or indicating – Thickness or uniformity of thickness determined

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

427 44, 427131, 427132, B05D 512

Patent

active

049370936

ABSTRACT:
A method for measuring the thickness of a multi-layer magnetic recording medium which provides a high accuracy and which can be used for continuous on-line monitoring of product thickness. First, first and second magnetic layers are simultaneously coated onto a running nonmagnetic support to form the recording medium. The first and second magnetic layers are made of materials having different responses to fluorescent X-rays. Then, the thickness of at least one of said first and second layers is measured by exposing the recording medium to fluorescent X-rays.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for measuring thickness of magnetic recording medium does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for measuring thickness of magnetic recording medium, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for measuring thickness of magnetic recording medium will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1124868

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.