Method for measuring the thickness of a mail item

Details Method for measuring the thickness of a mail item Method for measuring the thickness of a mail item

2006-12-19

2006-12-19

Lee, Hwa (Andrew) (Department: 2877)

Optics: measuring and testing

Dimension

Thickness

Reexamination Certificate

active

07151608

ABSTRACT:
A method of using reflection of a laser ray (LZ) for measuring the thickness (e) of a flat mail item (1) consists in nipping the mail item by means of an elastically deformable member (3) that has a first surface (4a) in contact with one face of said mail item, and a reflective second surface (4b) substantially parallel to said first surface, and in directing the laser ray onto said reflective second surface (4b) for the purpose of measuring the thickness of the mail item.

REFERENCES:
patent: 4937460 (1990-06-01), Duncan et al.
patent: 6032946 (2000-03-01), Marshall et al.
patent: 6100986 (2000-08-01), Rydningen
patent: 6644649 (2003-11-01), Chaume et al.
patent: 6757069 (2004-06-01), Bowles
patent: 199 59 570 (2001-05-01), None
patent: 0 816 931 (1998-01-01), None

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