Optics: measuring and testing – Shape or surface configuration – Triangulation
Reexamination Certificate
2008-07-01
2008-07-01
Toatley, Jr., Gregory J. (Department: 2877)
Optics: measuring and testing
Shape or surface configuration
Triangulation
C250S201300
Reexamination Certificate
active
07394552
ABSTRACT:
Method and device for determining one or more Z distances from an object surface to a reference plane, for example the primary plane of the primary objective of a microscope. By projecting an optical pattern onto an object, and subsequently detecting and computationally evaluating the object's reflection of this pattern by means of an image processing unit, it is possible to obtain relief-like imaging of the object and to identify the individual Z distances, irrespective of the object's contouring.
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Foley & Lardner LLP
Leica Microsystems AG
Toatley , Jr. Gregory J.
Valentin Juan D
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