Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1990-10-31
1993-06-29
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324 716, 505 1, 505843, H01B 1200, G01N 2700, G01R 2726
Patent
active
052237982
ABSTRACT:
The present invention provides a method for measuring the intragranular and ntergranular critical current of a granular superconductive material, comprising the steps of: 1) conducting a substantially rectangular electronic pulse through the material so as to conduct a current through the material such that when the intergranular critical current of the material is exceeded, any grains present in the material remain in a superconducting state when the current level is below the intragranular critical current; 2) measuring the current through the material while conducting the pulse; 3) measuring a voltage difference across the material while conducting the pulse; 4) determining the intergranular critical current through the material by discerning a non-zero voltage difference across the material and contemporaneously measuring the current; and 5) determining the intragranular critical current through the material by varying the current to discern a current level at which the electrical resistance of the material increases to that of the non-superconducting state as the grains of the material transition from the superconducting to a non-superconducting state. This method may also be used to determine the critical current of a homogeneous superconductive material.
REFERENCES:
patent: 3390330 (1968-06-01), Meyerhoff et al.
patent: 3428891 (1969-02-01), Purcell et al.
patent: 3469184 (1969-09-01), Lambe et al.
patent: 4777437 (1988-10-01), Tashiro et al.
patent: 4873482 (1989-10-01), Gray
patent: 4947118 (1990-08-01), Fujimaki et al.
Jones Thomas E.
McGinnis Wayne C.
Fendelman Harvey
Kagan Michael A.
Keough Thomas Glenn
Regan Maura K.
The United States of America as represented by the Secretary of
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