Method for measuring the real contact area in connectors

Measuring and testing – Surface and cutting edge testing

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73432R, G01B 2128

Patent

active

045585903

ABSTRACT:
A method to measure the real contact surface area of a connector or pin is disclosed. The pin and the connector is Gold plated. The pin or the connector is coated with platinum. The pin surface and the connector surface actually comprise a multitude of peaks and valleys, termed asperites. If the pin is chosen to be coated with the platinum, the platinum coated pin is mated with a connector. A portion of the pin surface contacts a corresponding portion of the connector surface. The portion of the pin surface and the corresponding portion of the connector surface is termed a real contact surface area. The pin and connector are separated. The platinum formerly adhering to the real contact surface area of the pin is removed and adheres to the real contact surface of the gold plated connector. Using a metallograph or a scanning electron microscope, the real contact surface of the connector or pin is studied and observed. Since the visual image of platinum is substantially different than the visual image of Gold, the real contact surface area of the pin (and of the connector) is readily discernable. Using an image analyzer, the real contact surface area on the pin and on the connector is measured.

REFERENCES:
patent: 3447366 (1969-06-01), Villalobos
patent: 3755659 (1973-08-01), Bolhuis
patent: 4099967 (1978-07-01), Schumacher et al.
patent: 4247575 (1981-01-01), O'Connel et al.
"Replica Method for Examining Surface Profiles"; The Review of Scientific Instruments; vol. 30, No. 6; Jun. 1959; pp. 444-446; A. P. Young et al.
"Digital Model of Switching Element Contact Surface", J. Francyk, Institute of Telecommunication and Acoustics Technical University of Wroclaw, pp. 555-559.
"The Microworld of the Contact Spot", J. B. P. Williamson, Williamson Interface, Malvern Worcestershire, England, pp. 1-10.

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