Method for measuring the optical and physical thickness of...

Optics: measuring and testing – By light interference – Having light beams of different frequencies

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C356S503000, C356S504000, C356S477000

Reexamination Certificate

active

07057735

ABSTRACT:
A method and apparatus for measuring the optical thickness and absolute physical thickness of an optically transparent object utilizes a reflective interferometric process. A broadband optical signal is directed toward the object to be measured, and a pair of signals reflected off of the object are processed to determine the optical thickness of the object. When used with an optical fiber preform, the technique can be used to measure the outer diameter of the preform and control the drawing process. If the index of refraction of optically transparent object is known, the absolute physical thickness can also be determined.

REFERENCES:
patent: 4021217 (1977-05-01), Bondybey et al.
patent: 5228893 (1993-07-01), Smithgall et al.
patent: 5657124 (1997-08-01), Zhang et al.
patent: 5828448 (1998-10-01), Jakobsen et al.
patent: 6633392 (2003-10-01), Singh et al.
A. Ashkin, J.M. Dziedzic, R. H. Stolen, “Outer Diameter Measurement of Low Birefringence Optical Fibers by a New Resonant Backscatter Technique” Applied Optics, Jul. 1, 1981, vol. 20, No. 13.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method for measuring the optical and physical thickness of... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for measuring the optical and physical thickness of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for measuring the optical and physical thickness of... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3655855

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.