Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Piezoelectric crystal testing
Patent
1995-03-20
1996-12-24
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Piezoelectric crystal testing
324655, G01R 2922
Patent
active
055876633
ABSTRACT:
The present invention discloses a method for obtaining frequency parameters to determine the resonator inductances of a crystal. Under this method, a plurality of frequencies are applied to a first electrode. This application is performed once while the second electrode and the common electrode are connected by a short circuit, and then again when the second electrode and the common electrode are capactively connected or open circuited. During each application of the plurality of frequencies to the crystal, the phase response for the output of the resonator circuit is monitored. Then the time response of the crystal is determined. Next, the time delay relative maxima for the time response is determined. Finally, the frequencies at which the time delay relative maxima occur are determined. These frequencies correspond to the inflection points where the change in phase goes from monotonically increasing to monotonically decreasing. This process is repeated with the crystal turned around in the test fixture to obtain a second set of frequencies. These frequencies are then used to calculate the resonator inductances of the crystal. Alternatively, all of the critical frequencies can be determined with the second electrode and the common electrode connected by a short circuit. In this case, however, the critical frequencies correspond to the time delay maxima and minima for the time response. This method is applicable regardless of the frequencies of the resonators or the amount of frequency separation between the resonators.
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Roberts Gerald E.
Roberts Michael E.
Brown Glenn W.
Wieder Kenneth A.
XTAL Technologies, Ltd.
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