Scanning-probe techniques or apparatus; applications of scanning – Particular type of scanning probe microscopy or microscope;... – Atomic force microscopy or apparatus therefor – e.g. – afm probes
Reexamination Certificate
2008-11-24
2010-12-14
Wells, Nikita (Department: 2881)
Scanning-probe techniques or apparatus; applications of scanning
Particular type of scanning probe microscopy or microscope;...
Atomic force microscopy or apparatus therefor, e.g., afm probes
C850S032000, C850S040000, C850S001000
Reexamination Certificate
active
07854015
ABSTRACT:
A scanning probe microscope and method for operating the same are disclosed. The microscope includes a probe mount for attaching a probe, an electro-mechanical actuator, a probe position signal generator, an impulse signal generator and a servo. A probe tip is mounted on a first end of a cantilever arm, a second end of the cantilever arm being mounted on a mechanical vibrator that causes the second end to vibrate in response to a drive signal. The probe position signal generator generates a position signal indicative of a position of the probe relative to the second end of the cantilever arm. The impulse signal generator measures a quantity related to an impulse imparted to the probe tip by the interaction between the tip and the local characteristics of the sample. The servo operates the electro-mechanical actuator so as to maintain the measured quantity at a predetermined value.
REFERENCES:
patent: 2006/0257286 (2006-11-01), Adams
patent: 2009/0320167 (2009-12-01), Kobayashi et al.
patent: 2010/0128342 (2010-05-01), Abramovitch
Agilent Technologie,s Inc.
Wells Nikita
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