Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1993-07-21
1996-03-19
Rosenberger, Richard A.
Optics: measuring and testing
By polarized light examination
With light attenuation
G01B 1124
Patent
active
055007376
ABSTRACT:
A method for measuring the contour of a surface using a high intensity light source, optics for projecting a line of light on the surface to illuminate a selected contour feature of the surface, an optical detector which generates an image of the selected contour feature, and a processing unit which fits at least one contour segment to the image of the selected contour feature and determines contour characteristics from the contour segment. The method includes a calibration step which corrects for distortion and keystone effect in the image caused by off-axis imaging of the illuminated contour feature by adjusting vertical and horizontal grid lines of an electronically created image with the off-axis image of the contour surface.
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Donaldson Charles W.
Gantner Randall C.
Lestage John J.
Miller Kenneth E.
General Electric Company
Hess Andrew C.
Narciso David L.
Rosenberger Richard A.
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