Method for measuring the concentration of impurities in...

Details Method for measuring the concentration of impurities in... Method for measuring the concentration of impurities in...

2006-06-27

2006-06-27

Wells, Nikita (Department: 2881)

Radiant energy

Ionic separation or analysis

Methods

C250S287000, C702S024000

Reexamination Certificate

active

07067800

ABSTRACT:
A method for the quantitative analysis of the impurities content in nitrogen, hydrogen or oxygen by means of ion mobility spectrometry is described. The method involves using pure argon or a mixture, having no impurities, containing argon and the gas to be analyzed, as a counterflow gas in the separation zone of the ion mobility spectrometer.

REFERENCES:
patent: 5457316 (1995-10-01), Cohen et al.
patent: 5955886 (1999-09-01), Cohen et al.
patent: 6229143 (2001-05-01), Wernlund
patent: 6639214 (2003-10-01), Ketkar et al.
patent: 1 154 268 (2001-11-01), None
patent: WO 00/52432 (2000-09-01), None
http://www.scottsemicon.com/mixes/moxygen.html, p. 1, Dec. 12, 2000.
http://www.scottsemicon.com/mixes/mhydrogen.html, p. 1, Dec. 12, 2000.

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