Chemistry: analytical and immunological testing – Involving diffusion or migration of antigen or antibody
Reexamination Certificate
2005-09-06
2008-11-11
Chin, Christopher L (Department: 1641)
Chemistry: analytical and immunological testing
Involving diffusion or migration of antigen or antibody
C385S012000, C385S129000, C385S130000, C422S051000, C422S082050, C422S082110, C435S287200, C435S288700, C436S164000, C436S525000, C436S805000
Reexamination Certificate
active
07449343
ABSTRACT:
It is an object of the present invention to provide a measurement method which can suppress noise when a specific binding reaction between a physiologically active substance and a test substance is measured using a surface plasmon resonance measurement device. The present invention provides a method for measuring a change in surface plasmon resonance which comprises: using a surface plasmon resonance measurement device comprising a metal film, a light source for generating a light beam, an optical system for allowing the above-described light beam to enter the interface of the metal film so that total reflection conditions can be obtained at the interface thereof and so that various incidence angles can be included, a flow channel system comprising a cell formed on the above-described metal film, and a light-detecting means for detecting the state of surface plasmon resonance by measuring the intensity of the light beam totally reflected at the above interface, and exchanging the liquid contained in the above flow channel system with another liquid, wherein the liquid in the above-described flow channel system is exchanged with another liquid obtained by eliminating insoluble matters from a measurement solvent, and the change in surface plasmon resonance is then measured in a state where the flow of the liquid has been stopped.
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Bothner, et al., “Defining the Molecular Basis of Arf and Hdm2 Interactions”, Journal of Molecular Biology, London, GB, 2001, vol. 314, No. 2, pp. 263-277.
Chin Christopher L
FUJIFILM Corporation
Sughrue & Mion, PLLC
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