Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2007-11-16
2010-12-28
He, Amy (Department: 2831)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S686000
Reexamination Certificate
active
07859272
ABSTRACT:
A method for measuring a speed of a conductor slipping through a capacitive sensor. The method includes: sampling a capacitance of a sensing electrode at each preset time; determining a first threshold value and a second threshold value according to a peak value of the capacitance when the capacitance achieves the peak value; and determining the speed of the conductor slipping through the capacitive sensor by the first period and the second period, wherein the first period is defined as a period of time ranging from the time when the capacitance reaches the first threshold value to the time when the capacitance reaches the peak value and the second period is defined as a period of time ranging from the time when the capacitance reaches the peak value to the time when the capacitance reaches the second threshold value.
REFERENCES:
patent: 2007/0032967 (2007-02-01), Feen et al.
patent: 2008/0042971 (2008-02-01), Sachs
Liao Tung-Tsai
Lo Li Sheng
Generalplus Technology Inc.
He Amy
Muncy Geissler Olds & Lowe, PLLC
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