Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Reexamination Certificate
2005-08-05
2008-01-01
Deb, Anjan (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Parameter related to the reproduction or fidelity of a...
C324S613000, C324S076190, C702S179000, C702S183000, C702S189000
Reexamination Certificate
active
07315172
ABSTRACT:
A mechanism for measuring noise densities below the noise floor of a measuring instrument. The measuring instrument may first acquire a fully-averaged reference spectral noise density trace and estimate corresponding reference statistical parameters. Based on the reference statistical parameters, the measuring instrument may construct a reference spectral noise density distribution. The measuring instrument may also acquire a fully-averaged sum spectral noise density trace and estimate corresponding sum statistical parameters. Based on the sum statistical parameters, the measuring instrument may construct a sum spectral noise density distribution. The measuring instrument may extract a spectral noise density distribution from the reference and sum distributions. The measuring instrument may also determine a confidence interval based on a desired confidence level. The measuring instrument may then determine a desired spectral noise density measurement based on an extracted mean of the spectral noise density and the computed confidence interval.
REFERENCES:
patent: 4244024 (1981-01-01), Marzalek et al.
patent: 4253152 (1981-02-01), Holdaway
patent: 4264958 (1981-04-01), Rowell, Jr. et al.
patent: 5337014 (1994-08-01), Najle et al.
patent: 6229316 (2001-05-01), Fukui et al.
patent: 6275020 (2001-08-01), Nagano
patent: 6496134 (2002-12-01), Asahina
patent: 6515276 (2003-02-01), Baney et al.
patent: 6614527 (2003-09-01), Fuhrmann et al.
patent: 6621277 (2003-09-01), Mar
patent: 6675106 (2004-01-01), Keenan et al.
patent: 6700366 (2004-03-01), Truesdale
patent: 6775840 (2004-08-01), Naegel et al.
patent: 2004/0100244 (2004-05-01), Kurosawa
A. A. Moulthrop and M. S. Muha; “Accurate Measurement of Signals Close to the Noise Floor on a Spectrum Analyzer”; IEEE Trans. on Microwave Theory and Techniques; Nov. 1991; pp. 1882-1885; vol. 39, No. 11.
“Spectrum Analyzer Measurements and Noise—Application Note 1303”; Agilent Technologies, Inc.; Feb. 11, 2003; 32 pages; U.S.A.
Deb Anjan
Dole Timothy J
Hood Jeffrey C.
Lewin Mario J.
Meyertons Hood Kivlin Kowert & Goetzel P.C.
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