Method for measuring retarded light through very long baseline i

Details Method for measuring retarded light through very long baseline i Method for measuring retarded light through very long baseline i

1997-03-12

1998-12-08

Turner, Samuel A.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

G01B 902

Patent

active

058478302

ABSTRACT:
Methods are provided for measuring retarded light that takes longer than x/c time to travel through a vacuum to a detector x distance from the source. The method exploits the frame invariance of in vacuo light speed c and the quantum mechanical nature of photons. It includes placing instrumentation packages consisting of detectors, broadband recording devices and atomic clocks at large distances from each other and from the source of an electromagnetic signal, such that the detectors are located at the extreme sidebands of light that has been diffracted by natural or artificial processes. The data are combined and analyzed using the standard techniques of very long baseline interferometry. This method is useful for providing on the order of a half minute of extra data from the past for distant astronomical events. The method is also useful for providing on the order of tenths of microseconds of extra data from the past for electric meteorological events.

REFERENCES:
patent: 4170776 (1979-10-01), MacDoran
patent: 5276500 (1994-01-01), Koehler

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