Image analysis – Applications – Manufacturing or product inspection
Patent
1995-03-16
1998-06-23
Boudreau, Leo
Image analysis
Applications
Manufacturing or product inspection
382147, 382288, 348 94, G06K 900, G06K 936
Patent
active
057713090
ABSTRACT:
The position of a hole is measured by image-sensing a holed portion formed in a workpiece and then measuring the central position of the holed portion based on an image of the holed portion on a screen of an image sensing apparatus. A plurality of hole edge points which coincide with a hole edge of the image of the holed portion are picked up. A regression ellipse which represents the image of the holed portion from coordinates of the hole edge points is calculated. The central position of the holed portion is obtained from coordinates of the center of the regression ellipse.
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patent: 5014331 (1991-05-01), Kurogane et al.
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Oda Koji
Yamaoka Naoji
Boudreau Leo
Honda Giken Kogyo Kabushiki Kaisha
Mehta Bhavesh
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