Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2011-07-19
2011-07-19
Nguyen, Ha Tran T (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S750010, C702S136000
Reexamination Certificate
active
07982486
ABSTRACT:
The present invention provides a method for measuring the PN-junction temperature of a light-emitting diode (LED), which uses a reference voltage to establish the function of current, real power, power factor, or driving-time interval on temperature. The initial and thermal-equilibrium values of current, real power, power factor, or driving-time interval are measured, and hence the variations thereof are calculated. Referring to the pre-established function, the temperature change is given. By the temperature change and the initial temperature, the PN-junction temperature of the LED is thereby deduced.
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Chen Jyh-Chen
Hwu Farn-Shiun
Lin Ming-Te
Tai Kuang-Yu
Chow Ming
Industrial Technology Research Institute
Isla Rodas Richard
National Central University
Nguyen Ha Tran T
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