Method for measuring optoelectronic characteristics of...

Details Method for measuring optoelectronic characteristics of... Method for measuring optoelectronic characteristics of...

2005-05-24

2005-05-24

Le, Que T. (Department: 2878)

Radiant energy

Photocells; circuits and apparatus

Photocell controlled circuit

C250S205000

Reexamination Certificate

active

06897431

ABSTRACT:
A method for measuring optoelectronic characterstics of an organic light emitting diode. A computer, a power supply and a cavity are provided. The cavity has a tooling, on which at least one photodiode is mounted. A high temperature, high humidity, or high temperature and humidity condition is applied to the cavity. The computer is used to control the power supply for supplying a current or a voltage to the organic light emitting diode to generate a light with a brightness. A signal carrying brightness information of the light is then transmitted to the computer (two signals with different brightness have to be input to the computer first) for performing data process.

REFERENCES:
patent: 6333522 (2001-12-01), Inoue et al.

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