Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1990-07-24
1992-03-17
Turner, Samuel
Optics: measuring and testing
By particle light scattering
With photocell detection
356358, 356363, G01B 902
Patent
active
050962965
ABSTRACT:
A characteristic matrix S(j,i) of the system is preformed such that each row j is preformed at a predetermined constant optical path difference. Light from a laser is transmitted through the system at n different laser wavelengths, and a different datum is obtained at each wavelength whereby to obtain a set of n different data. A vector is formed from the n different data, and the characteristic matrix is multiplied by the vector to obtain a correlation vector. The maximum amplitude element of the correlation vector points to the row of a matrix which has the greatest correlation with the obtained data, so that the predetermined optical path difference of that row indicates the phase of the interferometer of the system. In a separate embodiment, the data vector is divided by the characteristic matrix to obtain a second matrix, and the second matrix is used to form an absolute deviation vector. In this method, the minimum value of the vector points to the row of the characteristic matrix which has least absolute deviation from the obtained data than any other one of the rows so that the predetermined optical path difference of this row is indicative of the phase of the interferometer. In a third embodiment, two sets of data are obtained at two different wavelengths whereby to obtain the optical path difference of the interferometer without ambiguity.
REFERENCES:
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patent: 4759628 (1988-07-01), Tatsuno et al.
patent: 4874244 (1989-10-01), Kersey
patent: 4973153 (1990-11-01), Yokokura et al.
Canadian Marconi Company
Kurtz, II Richard E.
Turner Samuel
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