Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1998-12-18
2000-03-14
Kim, Robert H.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356359, G01B 902
Patent
active
060380276
ABSTRACT:
A method for determining a thickness of a moving material having at least two optical interfaces. A length of material is transported along a transport path through a measurement region, and is maintained at a substantially constant velocity and a predetermined flatness. A beam of light is directed toward the moving length disposed within the measurement region, and a portion of the light reflected from the optical interfaces of the moving length is collected and directed toward an interferometer apparatus. The interferometer apparatus generates an interference signal representative of the collected light and analyzes a plurality of the interference signals to determine a thickness profile of the material in the first direction.
REFERENCES:
patent: 3319515 (1967-05-01), Flournoy
patent: 5473432 (1995-12-01), Sorin
patent: 5596409 (1997-01-01), Marcus et al.
patent: 5610716 (1997-03-01), Sorin et al.
patent: 5659392 (1997-08-01), Marcus et al.
patent: 5731876 (1998-03-01), Venkatesh et al.
patent: 5850287 (1998-12-01), Soran et al.
Gross Stanley
Harris Harry W.
Lee Jiann-Rong
Marcus Michael A.
Eastman Kodak Company
Kim Robert H.
Parulski Susan L.
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