Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent
1990-02-05
1992-01-14
Wieder, Kenneth A.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
324158R, 324642, G01R 3126, G01R 2706
Patent
active
050814141
ABSTRACT:
A method and apparatus measure the lifetime of a semiconductor material by directing microwave energy into the semiconductor material and by producing carriers within the semiconductor material by impinging light thereon. A non-metal material is interposed between the semiconductor material and a metallic surface, such that a portion of the microwave energy travels through the semiconductor material and the non-metal material and reflects off of the metallic surface and back through the non-metal material and the semiconductor material. Additionally, a heating member is provided for heating the semiconductor material, whereby the lifetime of the semiconductor material is determined according to characteristics of the reflected microwave energy and the temperature of the semiconductor material.
REFERENCES:
patent: 3919639 (1975-11-01), Graff et al.
patent: 3939415 (1976-02-01), Terasawa
patent: 4087745 (1978-05-01), Kennedy, Jr. et al.
patent: 4704576 (1987-11-01), Tributsch et al.
patent: 4739258 (1988-04-01), Schwarz
patent: 4949034 (1990-08-01), Imura et al.
Iba Kunio
Kusama Tateo
Nguyen Vinh P.
Semitex Co., Ltd.
Wieder Kenneth A.
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