Optics: measuring and testing – Of light reflection – With diffusion
Patent
1994-12-01
1997-06-17
Font, Frank G.
Optics: measuring and testing
Of light reflection
With diffusion
356 73, 128633, 128664, 128665, G01N 2147, G01N 2100, A61B 500, A61B 600
Patent
active
056402473
ABSTRACT:
Light having a predetermined wavelength and various incident angle components to be incident on a surface of a scattering medium to generate an equivalent point light source or a group of equivalent point light sources near or on the surface of the scattering medium, and light diffused during propagation in the scattering medium is detected outside, and considering isotropic light from the equivalent light sources is immediately diffused, the optically detected signal is processed to detect a predetermined parameter which is primary information and this predetermined parameter is processed to measure internal information which is secondary information in the scattering medium with high accuracy.
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Ohta Kazuyoshi
Tsuchiya Yutaka
Urakami Tsuneyuki
Eisenberg Jason D. Vierra
Font Frank G.
Hamamatsu Photonics K.K.
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