Method for measuring integrated circuit processor power...

Details Method for measuring integrated circuit processor power... Method for measuring integrated circuit processor power...

2005-10-11

2005-10-11

Tsai, Carol S. W. (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S057000, C702S060000, C702S064000, C702S069000, C702S124000

Reexamination Certificate

active

06954706

ABSTRACT:
A system and method for measuring integrated circuit processor power demand comprises calibrating one or more voltage controlled oscillators for use as ammeters, calibrating a calibration current source, wherein the calibration current source draws current through a inherent resistance, calibrating the inherent resistance, and interleaving said calibrations in time with calculating the processor power demand using a voltage that is measured across the inherent resistance.

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