Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent
1988-01-05
1989-11-07
McGraw, Vincent P.
Optics: measuring and testing
Inspection of flaws or impurities
Having predetermined light transmission regions
250561, 356430, G01N 2189
Patent
active
048787531
ABSTRACT:
The specification describes a method for measuring the offset between regular images of, for instance, halftone dots and double images thereof, in which a test screen pattern is printed along an edge of the paper web to be printed which consists of two rows of test pattern strips representing a fishbone pattern. Using two sensors the gray values of the two test pattern rows are scanned and supplied to a double element printing measuring device. On the basis of the results of measurement and the geometrical relationships of the test strips and of the test edges arising owing to double printing phenomena the degree of double print offset may be determined. The method may be used for on line measurement of the degree of double print offset during the operation of the printing press.
REFERENCES:
patent: 2278933 (1942-04-01), Kott
Man Technologie GmbH
McGraw Vincent P.
LandOfFree
Method for measuring double print offset in printing systems does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for measuring double print offset in printing systems, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for measuring double print offset in printing systems will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-80471