Optics: measuring and testing – Refraction testing
Patent
1992-09-16
1994-05-03
Evans, F. L.
Optics: measuring and testing
Refraction testing
356 731, 356136, G01N 2143
Patent
active
053092147
ABSTRACT:
A method for measuring a refractive index profile and distributed dispersion of a sample by measuring refractive indices at a plurality of wavelengths at measuring points on the sample and calculating a refractive index profile at a main wavelength of the sample from the measured refractive indices. A condenser optical system for carrying out this method comprises a converging optical system for converging light beams emitted from light sources, a stop for shaping a wave front, a collimator optical system for transforming light beams having passed through the stop into parallel light beams, a relay lens system for converging these light beams and returning these light beams again to parallel light beams, an alignment stop disposed at a location of a parfocal point of the relay lens system, a condenser lens system for focusing light beams having passed through the relay lens system onto the measuring points, a light beam splitter means allowing light beams travelling toward the measuring points to pass therethrough and reflecting light beams returned from the measuring points, a photodetector for receiving light beams split by the light beam splitter means, and an alignment optical system having an alignment mechanism for aligning the light beams by using outputs from the photodetector.
REFERENCES:
Zhu et al; "Scanning Total Reflection Method for Refractive-Index Profiling" Japanese Journal of Applied Physics, vol. 28, No. 8, Aug. 1989, pp. 1497-1500.
Evans F. L.
Olympus Optical Co,. Ltd.
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