Method for measuring curved surface of workpiece, program...

Details Method for measuring curved surface of workpiece, program... Method for measuring curved surface of workpiece, program...

2007-07-31

2007-07-31

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system

Dimensional determination

C702S167000

Reexamination Certificate

active

10965335

ABSTRACT:
A theoretical expression of a workpiece (W) the curved surface of which is measured by a measuring probe (110) equipped with a stylus (111) is specified, a measuring area where the measurement is executed on the measuring surface of the workpiece (W) is determined, and the axis angles of the stylus (111) are determined based on the coordinate values and the normal vector of a representative point determined in the measuring area.

REFERENCES:
patent: 4166323 (1979-09-01), Maag
patent: 4532715 (1985-08-01), Sterki
patent: 4901253 (1990-02-01), Iwano et al.
patent: 5392644 (1995-02-01), Frazier
patent: 6154713 (2000-11-01), Peter et al.
patent: 198 21 371 (1999-11-01), None
patent: 101 31 160 (2003-01-01), None
patent: WO 02/23292 (2002-03-01), None

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