Method for measuring current distribution in an integrated circu

Details Method for measuring current distribution in an integrated circu Method for measuring current distribution in an integrated circu

1995-06-07

1997-09-02

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324 96, 324750, 324752, G01R 1900, G01R 3100

Patent

active

056636520

ABSTRACT:
An apparatus and method for measuring the current distribution in an integrated circuit with high time resolution is described incorporating a magneto-optic film, a linearly polarized light beam and a means for measuring the magneto-optic polarization rotation of a light beam and circuitry for synchronizing test pulses in an integrated circuit. The invention overcomes the problem of determining current distribution as a function of time and location in an integrated circuit with 1 psec time resolution and 1 micrometer spatial resolution.

REFERENCES:
patent: 3474428 (1969-10-01), Nelson et al.
patent: 3516080 (1970-06-01), Smith
patent: 3680065 (1972-07-01), Almasi et al.
patent: 4973899 (1990-11-01), Jones et al.
patent: 4983025 (1991-01-01), Umemura

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