Method for measuring capacitance and equivalent parallel...

Details Method for measuring capacitance and equivalent parallel... Method for measuring capacitance and equivalent parallel...

2007-05-29

2007-05-29

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

Reexamination Certificate

active

11261699

ABSTRACT:
CXis measured in the presence of RPby charging CXwith a constant current ICfor a period time and taking four (time, voltage) pairs: (tA,VA), (tB,VB), (tC,VC) and (tD,VD). The first pair are sufficiently close together that the short straight line segment connecting (tA, VA) and (tB, VB) is not significantly different from the corresponding segment of a true graph of the capacitor's actual charging. A similar requirement is imposed on the time interval between tCand tD. The time interval tAtBneed not be the same as tCtD. The interval tBtCshould be long enough that if there is significant RPpresent then there is at least a discernable difference between the true graph and a straight line between the first pair and the second. CXand RPare computed as a function of the four pairs and IC, and CXmay then be diminished by a previously measured value for a stray capacitance present in the absence of CX.

REFERENCES:
patent: 5838294 (1998-11-01), Praiswater
patent: 2002/0118051 (2002-08-01), Suzuki et al.

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