Method for measuring analog channel resistance of a...

Details Method for measuring analog channel resistance of a... Method for measuring analog channel resistance of a...

2007-08-27

2009-11-10

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

Reexamination Certificate

active

07615991

ABSTRACT:
A semiconductor device and a method for measuring an analog channel resistance thereof are provided. The semiconductor device includes a substrate, a gate insulating layer and a gate formed on the substrate, a source and a drain formed in the substrate and at both sides of the gate, a source sense connected to the source, and a drain sense connected to the drain.

REFERENCES:
patent: 4996570 (1991-02-01), Van Houten et al.
patent: 5130765 (1992-07-01), Van Houten et al.

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