Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1983-02-18
1985-12-17
Willis, Davis L.
Optics: measuring and testing
By particle light scattering
With photocell detection
356351, 356352, 356358, G01B 902, G01B 1102
Patent
active
045589526
ABSTRACT:
A method for measuring an optical length of light path based on use of multiple-beam interference of light and carried into effect by forming an original light beam with two collinear components having mutually independent polarizations and different frequencies in such a manner that when forming each of the following interfering light beams from the preceding one, polarizations of the light components having different frequencies are mutually converted, whereupon the interfered light is converted into an electric signal and its phase is measured, by which the light path optical length is determined. A laser interferometer carrying said method into effect comprises: a laser and arranged consecutively along the direction of run of the light beam: a device for offsetting the frequency of one of the light components, reflecting elements, a polarizing element for separating the light of the interfering beams according to polarization, and a photoelectric converter of the interfered light into an electric signal, as well as a unit for measuring the phase of an electric signal, connected to the photoelectric converter and also a birefringent plate located between the reflecting elements and adapted for mutual conversion of polarizations of the two light components.
REFERENCES:
patent: 4340304 (1982-07-01), Massie
Jacobs et al., "Measurement of Dimensional Stability" Final report Under Contract NAS8-28661, pp. 1-21, 7/75.
Lindborg Reichardt, Jenaer Rundschau, Journal No. 3, 1978, p. 137.
N. A. Massie, Applied Optics, 1980, pp. 154-160.
M. Born & E. Wolf, Principles of Optics, 1968, pp. 322-333.
Bliznjuk Jury A.
Kulesh Vladimir P.
Moskalik Leonid M.
Orlov Anatoly A.
Shtandel Stanislav K.
Koren Matthew W.
Willis Davis L.
LandOfFree
Method for measuring an optical length of light path and a laser does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method for measuring an optical length of light path and a laser, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for measuring an optical length of light path and a laser will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2171923